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to 10 of 4059 (Search time: 0.0 seconds).
Vacuum leak detection method using index regression and correction for semiconductor equipment in a vacuum chamber
oa mark
Ha, Taekyung;
Shin, Hyunjung
2021-12-01
Applied Sciences (Switzerland), Vol.11
MDPI
Graph-structured data generation and analysis for anomaly detection in an automated manufacturing process
Kim, Namki;
Gao, Xinpu;
Yang, Jeongsam
2024-10-01
Journal of Mechanical Science and Technology, Vol.38, pp.5617-5625
Korean Society of Mechanical Engineers
APAD: Autoencoder-based Payload Anomaly Detection for industrial IoE
Kim, Sung Jin;
Jo, Woo Yeon;
Shon, Taeshik
2020-03-01
Applied Soft Computing Journal, Vol.88
Elsevier Ltd
Defect detection using deep learning-based yolov3 in cross-sectional image of additive manUfactUring
oa mark
Choi, Byungjoo;
Choi, Yongjun;
Lee, Moon Gu
;
Kim, Jung Sub;
Lee, Sang Won;
Jeon, Yongho
2021-01-01
Archives of Metallurgy and Materials, Vol.66, pp.1037-1041
Polska Akademia Nauk
MPFDT: A Fault and Anomaly Diagnosis Tool for PLC Controlled Manufacturing Systems
ARUP GHOSH
2018-08
The Graduate School, Ajou University
LCD 공정에서 설비 센서 데이터를 활용한 이상 패턴 탐지 및 예측
송세리
2021-02
The Graduate School, Ajou University
Fault Detection with Index Regression Correction and Variational Smoothing for Semiconductor Equipment Sensor Signal
하태경
2022-02
The Graduate School, Ajou University
Nucleic Acid Detection by a Target-Assisted Proximity Proteolysis Reaction
Park, Hyeon Ji;
Yoo, Tae Hyeon
2018-10-26
ACS Sensors, Vol.3, pp.2066-2070
American Chemical Society
반도체 생산라인에서 시뮬레이션을 이용한 병목공정 탐지 프레임워크
Yang Ka Ram
2015-02
The Graduate School, Ajou University
Attention-guided residual frame learning for video anomaly detection
Yu, Jun Hyung;
Moon, Jeong Hyeon;
Sohn, Kyung Ah
2023-03-01
Multimedia Tools and Applications, Vol.82, pp.12099-12116
Springer
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