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to 10 of 2048 (Search time: 0.187 seconds).
SAGE: toward on-the-fly gradient compression ratio scaling
Yoon, Daegun;
Jeong, Minjoong;
Oh, Sangyoon
2023-07-01
Journal of Supercomputing, Vol.79, pp.11387-11409
Springer
A Robust Test Architecture for Low-Power AI Accelerators
Lee, Hayoung
;
Lee, Juyong;
Kang, Sungho
2024-01-01
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Institute of Electrical and Electronics Engineers Inc.
CRBF: Cross-Referencing Bloom-Filter-Based Data Integrity Verification Framework for Object-Based Big Data Transfer Systems
oa mark
Kasu, Preethika;
Hamandawana, Prince
;
Chung, Tae Sun
2023-07-01
Applied Sciences (Switzerland), Vol.13
Multidisciplinary Digital Publishing Institute (MDPI)
An Efficient Fault-Tolerant and Reliable Data Integrity Framework for Object-Based Big Data Transfer Systems
PREETHIKA KASU
2022-08
The Graduate School, Ajou University
TPBF: Two-Phase Bloom-Filter-Based End-to-End Data Integrity Verification Framework for Object-Based Big Data Transfer Systems
oa mark
Kasu, Preethika;
Hamandawana, Prince
;
Chung, Tae Sun
2022-05-01
Mathematics, Vol.10
MDPI
Novel data-placement scheme for improving the data locality of Hadoop in heterogeneous environments
Bae, Minho;
Yeo, Sangho;
Park, Gyudong;
Oh, Sangyoon
2021-09-25
Concurrency and Computation: Practice and Experience, Vol.33
John Wiley and Sons Ltd
An ECC-based mutual data access control protocol for next-generation public cloud
oa mark
Khan, Naveed;
Jianbiao, Zhang;
Lim, Huhnkuk;
Ali, Jehad
;
Ullah, Intikhab;
Salman Pathan, Muhammad;
Chaudhry, Shehzad Ashraf
2023-12-01
Journal of Cloud Computing, Vol.12
Springer Science and Business Media Deutschland GmbH
WAVE: designing a heuristics-based three-way breadth-first search on GPUs
Yoon, Daegun;
Jeong, Minjoong;
Oh, Sangyoon
2023-04-01
Journal of Supercomputing, Vol.79, pp.6889-6917
Springer
DLFT: Data and Layout Aware Fault Tolerance Framework for Big Data Transfer Systems
oa mark
Kasu, Preethika;
Hamandawana, Prince
;
Chung, Tae Sun
2021-01-01
IEEE Access, Vol.9, pp.22939-22954
Institute of Electrical and Electronics Engineers Inc.
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35
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33
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