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Showing results 1 to 10 of 778 (Search time: 0.0 seconds).

Positive Interaction between Charge Trapping and Polarization Switching in Metal-Interlayer-Ferroelectric-Interlayer-Silicon (MIFIS) Ferroelectric Field-Effect Transistor
  • Choi, Hyojun;
  • Kim, Giuk;
  • Lee, Sangho;
  • Shin, Hunbeom;
  • Lim, Youngjin;
  • Kim, Kang;
  • Kim, Do Hyung;
  • Oh, Il Kwon;
  • Park, Sang Hee Ko;
  • Ahn, Jinho;
  • Jeon, Sanghun
  • 2024-01-01
  • IEEE Electron Device Letters, Vol.45, pp.2351-2354
  • Institute of Electrical and Electronics Engineers Inc.
Enhancing Circularly Polarized Phosphorescence via Integrated Top-Down and Bottom-Up Approach
  • Park, Gyurim;
  • Jeong, Dong Yeon;
  • Yu, Seung Yeon;
  • Park, Jong Jin;
  • Kim, Jong H.;
  • Yang, Hoichang;
  • You, Youngmin
  • 2023-10-09
  • Angewandte Chemie - International Edition, Vol.62
  • John Wiley and Sons Inc
Observing hepatic steatosis with a commercially viable two-photon fluorogenic probe
  • Han, Jingjing;
  • Lee, Hyo Won;
  • Chen, Yahui;
  • Li, Haidong;
  • Kim, Hwan Myung;
  • Yoon, Juyoung
  • 2022-03-07
  • Materials Chemistry Frontiers, Vol.6, pp.553-560
  • Royal Society of Chemistry
Strategic Approach for Frustrating Charge Recombination of Perovskite Solar Cells in Low-Intensity Indoor Light: Insertion of Polar Small Molecules at the Interface of the Electron Transport Layer
  • Shin, So Jeong;
  • Alosaimi, Ghaida;
  • Choi, Min Jun;
  • Ann, Myung Hyun;
  • Jeon, Gyeong G.;
  • Seidel, Jan;
  • Kim, Jincheol;
  • Yun, Jae Sung;
  • Kim, Jong H.
  • 2022-11-28
  • ACS Applied Energy Materials, Vol.5, pp.13234-13242
  • American Chemical Society
Strong Interfacial Charge Trapping in Ultrathin SrRuO3on SrTiO3Probed by Noise Spectroscopy
  • Lee, Jung Woo;
  • Kim, Jiyeong;
  • Eom, Kitae;
  • Jeon, Jaeyoung;
  • Kim, Young Chul;
  • Kim, Hwan Sik;
  • Ahn, Yeong Hwan;
  • Kim, Sungkyu;
  • Eom, Chang Beom;
  • Lee, Hyungwoo
  • 2022-01-01
  • Journal of Physical Chemistry Letters, Vol.13, pp.5618-5625
  • American Chemical Society
Experimental Analysis on the Interaction Between Interface Trap Charges and Polarization on the Memory Window of Metal-Ferroelectric-Insulator-Si (MFIS) FeFET
  • Kim, Giuk;
  • Choi, Hyojun;
  • Lee, Sangho;
  • Shin, Hunbeom;
  • Lee, Sangmok;
  • Nam, Yunseok;
  • Kang, Hyunjun;
  • Shin, Seokjoong;
  • Kim, Hoon;
  • Lim, Youngjin;
  • Kim, Kang;
  • Oh, Il Kwon;
  • Ko Park, Sang Hee;
  • Ahn, Jinho;
  • Jeon, Sanghun
  • 2024-01-01
  • IEEE Transactions on Electron Devices, Vol.71, pp.6627-6632
  • Institute of Electrical and Electronics Engineers Inc.
Long-Lasting, Steady and Enhanced Energy Harvesting by Inserting a Conductive Layer into the Piezoelectric Polymeroa mark
  • Jang, Hak Su;
  • Kim, Gwang Hyeon;
  • Jeon, Dong Won;
  • Park, Hyeon Jun;
  • Bae, Bit Na;
  • Alluri, Nagamalleswara Rao;
  • Kim, Cheol Min;
  • Baek, Changyeon;
  • Lee, Min Ku;
  • Cho, Sung Beom;
  • Lee, Gyoung Ja;
  • Park, Kwi Il
  • 2025-02-19
  • Advanced Functional Materials, Vol.35
  • John Wiley and Sons Inc
Uncertainty and Irreproducibility of Triboelectricity Based on Interface Mechanochemistry
  • Fatti, Giulio;
  • Kim, Hyunseung;
  • Sohn, Changwan;
  • Park, Minah;
  • Lim, Yeong Won;
  • Li, Zhuohan;
  • Park, Kwi Il;
  • Szlufarska, Izabela;
  • Ko, Hyunseok;
  • Jeong, Chang Kyu;
  • Cho, Sung Beom
  • 2023-10-20
  • Physical Review Letters, Vol.131
  • American Physical Society
Design of a Small NEMP Simulator for the Immunity Test of Core Electronic Components in HEMP Environmentsoa mark
  • 2020-01-01
  • IEEE Access, Vol.8, pp.217773-217780
  • Institute of Electrical and Electronics Engineers Inc.
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