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Scattering Analysis of Modulated Corrugations in a Conducting Circular Cylinder and Study of RCS Reduction
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Publication Year
2019-11-01
Publisher
Institute of Electrical and Electronics Engineers Inc.
Citation
IEEE Transactions on Antennas and Propagation, Vol.67, pp.7162-7167
Keyword
Mode matching methodradar cross section (RCS)surface wavestransverse corrugations
Mesh Keyword
Corrugated surfacesElectromagnetic scatteringElectromagneticsMode matching methodOptical surface wavesTransverse corrugation
All Science Classification Codes (ASJC)
Electrical and Electronic Engineering
Abstract
In this communication, an electromagnetic boundary-value problem of modulated transverse corrugations in an infinite conducting circular cylinder is rigorously solved based on the Fourier transform, eigenfunction expansion, and the mode matching method. Radar cross section (RCS) of the modulated transverse corrugations is represented in the series form. Computation is performed to analyze scattering characteristics while varying depth, width, and period of the corrugations and to investigate the excitation of surface waves and concomitant RCS reduction.
Language
eng
URI
https://dspace.ajou.ac.kr/dev/handle/2018.oak/30835
DOI
https://doi.org/10.1109/tap.2019.2908020
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Type
Article
Funding
Manuscript received August 27, 2018; revised December 31, 2018; accepted February 28, 2019. Date of publication March 28, 2019; date of current version October 29, 2019. This work was supported by Basic Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Science and ICT (No. 2017R1A2B4001903), and was also supported bythe Basic Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Education (No. 2015R1A6A1A03031833) and the MSIT(Ministry of Science and ICT), Korea, under the ITRC(Information Technology Research Center) support program(IITP-2019-2018-0-01424) supervised by the IITP(Institute for Information & communications Technology Promotion). (Corresponding author: Yong Bae Park.) S. Lee and Y. B. Park are with the Department of Electrical and Com-II. FIELD ANALYSIS
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Park, Yong Bae박용배
Department of Electrical and Computer Engineering
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