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Development on the reconstruction of photothermal imaging method for subsurface structure
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dc.contributor.authorKim, Moojoong-
dc.contributor.authorYoo, Jaisuk-
dc.contributor.authorKim, Dong Kwon-
dc.contributor.authorKim, Hyunjung-
dc.date.issued2019-04-09-
dc.identifier.urihttps://dspace.ajou.ac.kr/dev/handle/2018.oak/30478-
dc.description.abstractAbstract: The photothermal imaging technique is a nondestructive inspection technique that visualizes the inside of a metal by utilizing the photothermal effect. Although the concept of photothermal imaging techniques has been proposed, systematic research on the characteristics thereof has not been conducted. This study attempts to enhance the measurement and reconstruction process for a photothermal imaging method. To detect the edge of a subsurface pattern more accurate, low-pass FFT (fast Fourier transform) filter for noise reduction of measured data, and derivative detectors are adopted for the reconstruction of photothermal imaging. The adopted methods are applied to and visualize 20 mm × 25 mm × 1.5 mm copper block including radius 5 mm, height 1 mm cylindrical resin as a subsurface pattern. The results show that the developed method can detect the edge of the resin subsurface 50% more accurately than the previous reconstruction method for photothermal imaging. Graphical abstract: [Figure not available: see fulltext.].-
dc.description.sponsorshipAcknowledgments This research was supported partly by the Basic Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Education (NRF-2015R1D1A1A01060704 and NRF-2017R1D1A1 B03035832).-
dc.language.isoeng-
dc.publisherSpringer Verlag-
dc.titleDevelopment on the reconstruction of photothermal imaging method for subsurface structure-
dc.typeArticle-
dc.citation.endPage339-
dc.citation.startPage329-
dc.citation.titleJournal of Visualization-
dc.citation.volume22-
dc.identifier.bibliographicCitationJournal of Visualization, Vol.22, pp.329-339-
dc.identifier.doi10.1007/s12650-018-0533-z-
dc.identifier.scopusid2-s2.0-85057119179-
dc.identifier.urlhttps://www.springer.com/journal/12650-
dc.subject.keywordDerivative edge detector-
dc.subject.keywordFilter-
dc.subject.keywordImaging techniques-
dc.subject.keywordNoise-
dc.subject.keywordPhotothermal-
dc.subject.keywordReconstruction-
dc.description.isoafalse-
dc.subject.subareaCondensed Matter Physics-
dc.subject.subareaElectrical and Electronic Engineering-
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Kim, Dong-Kwon김동권
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