Ajou University repository

Selective-Delay Garbage Collection Mechanism for Read Operations in Multichannel Flash-Based Storage Devices
Citations

SCOPUS

4

Citation Export

DC Field Value Language
dc.contributor.authorPaik, Joon Young-
dc.contributor.authorCho, Eun Sun-
dc.contributor.authorJin, Rize-
dc.contributor.authorChung, Tae Sun-
dc.date.issued2018-02-01-
dc.identifier.issn0098-3063-
dc.identifier.urihttps://dspace.ajou.ac.kr/dev/handle/2018.oak/30129-
dc.description.abstractFlash memory has been a dominant storage medium in consumer electronics. Its wide deployment results from the remarkable progress in garbage collection mechanism which resolves the inherent limitation, not-in-place-update property, of flash memory. In this paper, we propose a new garbage collection management scheme, called selective-delay garbage collection, which can be used to optimize read operations. In our proposal, garbage collections are allowed to proceed only if they do not block the execution of incoming read operations. For this, the proposed scheme cooperates with an event queue in storage devices of consumer electronics. When read operations in the event queue are likely to collide with a garbage collection request, the read operations are processed preferentially by delaying garbage collection. This reduces the average read latency by avoiding time-consuming garbage collections. The experimental results with realistic workloads show that average read latency decreases by up to 13.53%, and the time elapsed by garbage collections is reduced by up to 78.37%, whereas the increase in write latency is limited to 0.83%.-
dc.description.sponsorshipManuscript received January 1, 2018; revised February 12, 2018; accepted February 15, 2018. Date of publication March 8, 2018; date of current version March 29, 2018. This work was supported by the Basic Science Research Program through the National Research Foundation of Korea funded by the Ministry of Education under Grant 2017R1A6A3A11035567. (Corresponding author: Tae-Sun Chung.) J.-Y. Paik and T.-S. Chung are with the Department of Software, Ajou University, Suwon 443-749, South Korea (e-mail: lucadi@ajou.ac.kr; tschung@ajou.ac.kr).-
dc.language.isoeng-
dc.publisherInstitute of Electrical and Electronics Engineers Inc.-
dc.subject.meshGarbage collection-
dc.subject.meshIn-place update-
dc.subject.meshInherent limitations-
dc.subject.meshMultichannel-
dc.subject.meshRead latencies-
dc.subject.meshRead operation-
dc.subject.meshStorage medium-
dc.subject.meshsystem performance-
dc.titleSelective-Delay Garbage Collection Mechanism for Read Operations in Multichannel Flash-Based Storage Devices-
dc.typeArticle-
dc.citation.endPage126-
dc.citation.startPage118-
dc.citation.titleIEEE Transactions on Consumer Electronics-
dc.citation.volume64-
dc.identifier.bibliographicCitationIEEE Transactions on Consumer Electronics, Vol.64, pp.118-126-
dc.identifier.doi10.1109/tce.2018.2812062-
dc.identifier.scopusid2-s2.0-85043392696-
dc.subject.keywordConsumer electronics-
dc.subject.keywordflash memory-
dc.subject.keywordgarbage collection-
dc.subject.keywordsemiconductor devices-
dc.subject.keywordsystem performance-
dc.description.isoafalse-
dc.subject.subareaMedia Technology-
dc.subject.subareaElectrical and Electronic Engineering-
Show simple item record

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Chung, Tae-Sun Image
Chung, Tae-Sun정태선
Department of Software and Computer Engineering
Read More

Total Views & Downloads

File Download

  • There are no files associated with this item.