Ajou University repository

기존 측정점 재사용을 위한 유사도 기반의 CAIP 시스템 개발
  • 전혜성
Citations

SCOPUS

0

Citation Export

Advisor
양정삼
Affiliation
아주대학교 일반대학원
Department
일반대학원 산업공학과
Publication Year
2016-02
Publisher
The Graduate School, Ajou University
Keyword
Similarity comparisonOMM(On-Machine Measurement)Inspection featureMeasuring pointCollision detectSimilarity comparisonCollision detect
Description
학위논문(석사)--아주대학교 일반대학원 :산업공학과,2016. 2
Alternative Abstract
On-Machine Measurement (OMM), which measures workpieces where machining is progressing or finished in CNC machining center, has its own strength that is capable of measuring workpieces directly in work space without moving them. However, planning of measurement to determine measurement sequence and elements for each shape of complicated objects has its limitation requiring time-consuming tasks to generate measurement points mostly relying on skills of workers on site. This paper will suggest how to apply an existing and highly similar model’s measurement paths to a new model by analyzing similarity between existing 3D shapes whose measurement path are built and new models. For the purposes of similarity analysis, this paper extracted feature vectors from 3D shapes models which are able to express characteristics of shape models and then applied this feature vectors to histogram of probability distribution based on algorithm of similarity analysis. In addition, this paper developed CAIP system by correcting unapplied measurement points, which are generated by minute difference between two models when their similar measurement points are applied to a new model and then generate final measurement paths.
Language
eng
URI
https://dspace.ajou.ac.kr/handle/2018.oak/12153
Fulltext

Type
Thesis
Show full item record

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

Total Views & Downloads

File Download

  • There are no files associated with this item.