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Showing results 1 to 3 of 3

Design of a Compact Broadband Vector Network Analyzer to Diagnose a Semiconductor Process Chamber
  • Kim, Seong Jin;
  • Jung, Heechul;
  • Yu, Jong Won;
  • Kim, Jeong Wook;
  • Kim, Hanam;
  • Lee, Sang Won
  • 2025-01-01
  • IEEE Transactions on Instrumentation and Measurement, Vol.74
  • Institute of Electrical and Electronics Engineers Inc.
Development of Photovoltaic abnormal condition detection system using combined regression and Support Vector Machine
  • 2019-06-01
  • Energy, Vol.176, pp.457-467
  • Elsevier Ltd
Estimation of abnormal wave propagation by a novel duct map based on the average normalized path loss
  • Wang, Sungsik;
  • Lim, Tae H.;
  • Chong, Young J.;
  • Ko, Jinwon;
  • Park, Yong B.;
  • Choo, Hosung
  • 2020-04-01
  • Microwave and Optical Technology Letters, Vol.62 No.4, pp.1662-1670
  • John Wiley and Sons Inc.
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