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Rapid and Reliable Formation of Highly Densified Bilayer Oxide Dielectrics on Silicon Substrates via DUV Photoactivation for Low-Voltage Solution-Processed Oxide Thin-Film Transistors- Lee, Won June;
- Choi, Jun Gyu;
- Sung, Sujin;
- Kim, Chang Hyun;
- Na, Sekwon;
- Joo, Young Chang;
- Park, Sungjun;
- Yoon, Myung Han
- 2021-01-20
- ACS Applied Materials and Interfaces, Vol.13 No.2, pp.2820-2828
- American Chemical Society
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