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Showing results 1 to 2 of 2
An energy efficiency grading system for mobile applications based on usage patterns
Baek, Dusan;
Park, Jae Hyeon;
Lee, Jung Won
2018-12-01
Journal of Supercomputing, Vol.74 No.12, pp.6502-6515
Springer New York LLC
Defect management method for content-based document artifact test in software R&D project
Baek, Dusan;
Shin, Jong Hwan;
Lee, Byungjeong;
Lee, Jung Won
2018-01-01
Lecture Notes in Electrical Engineering, Vol.474, pp.1192-1198
Springer Verlag
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